Design consulting, support & optimisation for new & redesigns "Design for testability" (DfT)
- Identify & eliminate design flaws targeting testability & test time
- Improved test point placement
- Integration of new test strategies (JTAG/boundary-scan, cluster tests & functional tests)
- feasibility & realisation of "on-board" chip programming
- Extended contacting possibilities (Fine Pitch, Rigid Pin, Bead Probes,...)
- Component selection
- Validation of designs prior to design freeze